|November, 2013 - New photos of a Griffin tester being
used for radiation test have been added on
the Hilevel Customer Resource page. Just Login to the HiLevel Customer Resource page
and click the Photos button.
September, 2013 - The newest member of the Hilevel product line now has a webpage, the Griffin SEE-RAD Test System. This tester is optimized for See Event Effects testing and is now available.
August, 2013 - New application note on the Hilevel Q'nApps page for Symphony users. Q'nApps #62 shows using Timing On-the-Fly to set pins to pulse at twice the test clock rate.
June, 2013 - Three new application notes on the Hilevel Q'nApps page. Q'nApps #59 is on the Current Limit feature of Hilevel DUT power supplies. Q'nApps #60 clarifies Calibration and Diagnostics. Q'nApp #61 describes measuring pin-to-pin resistance.
March, 2013 - New manuals have been added on the Hilevel Customer Resource page for configuring Microsoft Visual Studio 2010 for Hilevel C programs. Just Login to the HiLevel Customer Resource page and click the "Hilevel Manuals" button to access "Configure Visual C++".
February, 2013 - A new section has been introduced on the Hilevel Customer Resource page: Hilevel White Papers. Just Login to the HiLevel Customer Resource page and click the button for "HiLevel White Papers".
January, 2013 - Two new Hilevel systems are now available. The DC3 Parametric tester and the CurveMasterTM curve tracer can be seen on our Products page.