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 17805 Sky Park Circle, Suite E, Irvine CA, 92614 |
The
G3 Hybrid is a state of the art system for fast Production test
throughput in DC test applications. The system combines the most
versatile offerings of features in a single zero-footprint system.
For
devices requiring DC and Continuity test capability only, G3H is a very
flexible cost-effective Production Test solution. This
approach
provides a DC test system with the capability to add logic resources
(AC/SCAN)
as well as analog resources for Mixed Signal. The HILEVEL
G3H embraces all of these great features while supporting SCAN, giving
you
the
ability to toggle every node in your chip.
Features  Test rates up to 200MHz (100MHz
All Modes) Eight high-speed clocks up to
500MHz with compliment outputs Two strobes per cycle Up to 1,024 DC
pins Up to 128
AC/DC logic
pins Up to 40 DUT
power supplies for
Multi-site testing Real time failure counter Display "capture fails only" mode High-speed acquisition search Full "next cycle" operation Scan
up to 128 chains, up to 8Gbit
64Meg test
vector depth
and capture depth Programmable loads and parallel
loads Multiple high-precision DC PMU
units Timing On-the-Fly
Mixed Signal
Option
with MX2 |