The wafer has been fully tested, cut and packaged. Today’s IC manufacturers are finding tremendous cost savings in performing just fast DC³ tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a “rack-n-stack” collection of instruments. Enter the HILEVEL DC³ Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC³ combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC³ includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.

The “Co-Optive” power of the DC³ sets it apart from other low-cost DC test solutions. The DC³ is designed to work in partnership with your own logic stimulus resource to take test beyond DC leakage and continuity. Now you can use a DC Parametric system to verify Voh, Vol, and more.