GRIFFIN III HYBRID
DESCRIPTION
The G3 Hybrid is a state of the art system for fast Production test throughput in DC test applications. The system combines the most versatile offerings of features in a single zero-footprint system. For devices requiring DC and Continuity test capability only, G3H is a very flexible cost-effective Production Test solution. This approach provides a DC test system with the capability to add logic resources (AC/SCAN) as well as analog resources for Mixed Signal. The HILEVEL G3H embraces all of these great features while supporting SCAN, giving you the ability to toggle every node in your chip.
CERTIFICATES
FEATURES
- Test rates up to 200MHz (100MHz All Modes)
- Eight high-speed clocks up to 500MHz with compliment outputs
- Two strobes per cycle
- Up to 1,024 DC pins
- Up to 128 AC/DC logic pins
- Up to 40 DUT power supplies for Multi-site testing
- Real time failure counter
- Display “capture fails only” mode
- High-speed acquisition search
- Full “next cycle” operation
- Scan up to 128 chains, up to 8Gbit
- 64Meg test vector depth and capture depth
- Programmable loads and parallel loads
- Multiple high-precision DC PMU units
- Timing On-the-Fly
- Mixed Signal Option with MX2
