GRIFFIN III

DESCRIPTION

The Griffin III system brings new performance efficiency to the Tester-in-a-Head tradition, a concept created and introduced by HILEVEL in 1987. This tester is a superior high-precision solution for Engineering, Production, and Failure Analysis test applications.

CERTIFICATES

FEATURES

  • Test rates up to 200MHz (100MHz All Modes)
  • Eight high-speed clocks up to 500MHz with compliment outputs
  • Two strobes per cycle
  • Up to 512 logic pins in ONE Chassis
  • Real time failure counter
    Display “capture fails only” mode
  • High-speed acquisition search
  • Full “next cycle” operation
  • Scan up to 128 chains, up to 8Gbit
  • 64Meg test vector depth and capture depth
  • Programmable loads and parallel loads
  • Multiple high-precision DC PMU units
  • Timing On-the-Fly
  • Mixed Signal Option with MX2

DOWNLOAD

Name Description Last Update Download
Griffin III Brochure Griffin III Brochure, 1.5M PDF 2016-02-11

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HILEVEL Technology, INC.
17805 Sky Park Circle, Suite E,
Irvine CA, 92614
contact@hilevel.com
(949) 263-8998